We provide support to a variety of high technology companies across the globe in the areas of thin films, semiconductors, photovoltaics, coatings, deposition processes, and matters relating to protection & verification of intellectual property and technology.
We also provide a surface analysis and advanced materials characterisation service (SIMS, TOF-SIMS, XPS, TEM/FIB) specialising in metrology of thin films, semiconductors, photovoltaic materials and nano layers.
A combination of our knowledge of the science of materials, an understating of the technologies together with many years of experience of advanced analytical techniques is a significant benefit. This provides an advantageous platform from which to support early stage development of new products, monitoring and failure analysis issues. Such support will enable our customers to innovate faster, optimise performance more effectively and maximise their competitive advantage.
We have an established track record in a number of successful cases relating to product claim and alleged patent infringement working with a number of blue chip clients in the USA, Europe and the Far East.
To better understand our customers’ evolving requirements and deliver innovative solutions, with a commitment to excellence.