​

​

About Us

We provide advanced surface analysis and material characterisation services to high-technology companies, aiding early-stage R&D, product monitoring and  critical failure analysis, serving clients across Europe,  USA, and Asia.

​

​Combining a knowledge of material science with over three decades of expertise in advanced analytical techniques, we deliver bespoke metrology solutions for thin films, semiconductors, and nanolayers thereby supporting our customers to innovate, optimize performance and maximize their competitive advantage.

​

Our Commitment

​​We provide a confidential and responsive service . We focus on understanding your key specific technical issue  and respond accordingly with pertinent customised solutions in a timely fashion

​

​​