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ABOUT US

We provide advanced surface analysis, material characterisation services  and consultancy to high technology companies across the globe, aiding their early-stage R&D projects, product monitoring and critical failure analysis with clients across Europe,  USA, and in the Far East​

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​Combining a knowledge of material science with over three decades of expertise in advanced analytical techniques, we deliver bespoke metrology solutions for thin films, semiconductors, and nanolayers thereby supporting our customers to innovate, optimize performance and maximize their competitive advantage.

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OUR COMMITMENT

​​We provide a confidential and responsive service . We focus on understanding your key specific technical issue  and respond accordingly with pertinent customised solutions in a timely fashion

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