FIB Preparation  for TEM analysis 

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  Applications of TEM and FIB 

  • Microstructure & Defects

  • Layer Thickness Measurements.

  • Failure Analysis

  • Reverse Engineering

  • Silicon , III/V and II/VI Materials

  • Coatings 

  • Particles 

  • Fibers 

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Oxide

Silicon

10 nm