Applications  

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• Surface and  Interface Contamination 

• Failure Analysis 

• Reverse Engineering 

• 3D _High resolution Chemical Mapping 

• Small area Depth Profiling

• Organic Depth Profiling

• Retrospective X-section Image reconstruction and Spectra

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• Pulsed Bi source for acquisition  

• Cs and O for sputtering : Inorganics

• Ar cluster for sputtering : Organics &Polymers