Applications  
  • Surface and  Interface Contamination 

  • Failure Analysis 

  • Reverse Engineering 

  • 3D _High resolution Chemical Mapping 

  • Small area Depth Profiling

  • Organic Depth Profiling

  • Retrospective X-section Image reconstruction and Spectra

Heading 1

TOF_NEW.png
  • Pulsed Bi source for acquisition  

  • Cs and O for sputtering : Inorganics

  • Ar cluster for sputtering : Organics &Polymers